Electron refraction and light polarization effects in angle-resolved photoemission spectra of Cu surfaces using 45 eV radiation

Abstract

Angle-resolved photoemission spectra of the low Miller-index faces of copper were taken with polarized 45 eV light for both surface normal and off-normal photoemission orientations. They reveal that low-energy photoelectrons emitted off-normal to the surface are strongly refracted toward the surface at the solid-vacuum interface; measured refraction angles are significantly (5̃0%) larger than predicted from a simple plane wave model. Furthermore, the spectra are found to be very sensitive to the orientation of the polarization of the exciting radiation with respect to the crystalline axes and the sample surface. Spectral dependence on light polarization is discussed in terms of direct transition selection rules for primary Mahan cones, influence of directionality on matrix elements, and direct transition contributions to the spectra from surface photoemission.