Abstract
Electron ptychography has been implemented in Scanning Transmission Electron Microscopy (STEM) to study materials with higher spatial resolution. High electron dose imposed by data redundancy requirement in electron ptychography is detrimental to the samples well-suited for ptychography, i.e., thin samples. In this work, we demonstrate a smart (Moiré) sampling strategy which allows dose reduction by orders of magnitude on periodic crystalline samples.
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