Abstract
We report electron paramagnetic resonance (EPR) results on the characteristics of the Mn activator in a ZnS:Mn thin film as a function of the film processing conditions. From the x-ray diffraction and EPR measurements of Mn in both ZnS:Mn powder and thin films deposited at the different substrate temperature and thermally treated in the vacuum, it was found that the effective Mn2+ concentration in a ZnS:Mn electroluminescent device could be changed by the annealing process, as well as the substrate temperature, during deposition.
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