Abstract
AbstractAnalytical scanning transmission electron microscopy has been used to establish the solid phase boundaries in the Ni–Cr binary system. Energy dispersive X-ray analysis of thin foils prepared from samples of a commercial 50Ni–50Cr alloy produced data which correlated well with the phase diagram proposed by Nash.MST/878
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have