Abstract
AbstractAnalytical scanning transmission electron microscopy has been used to establish the solid phase boundaries in the Ni–Cr binary system. Energy dispersive X-ray analysis of thin foils prepared from samples of a commercial 50Ni–50Cr alloy produced data which correlated well with the phase diagram proposed by Nash.MST/878
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
