Abstract
Niobium films were grown by molecular beam epitaxy on sapphire substrates of different orientations. A unique three-dimensional orientation relationship was determined between the Al 2O 3 substrate and the niobium film independent of substrate orientation: (0001) S‖(111) Nb and [2 11 0] S‖[1 1 0] Nb. This observation is in contrast with topotaxial relationships obtained between Al 2O 3 particles formed by internal oxidation of Nb Al alloys where close-packed planes are parallel: (0001) S‖(110) Nb. The atomistic structure of the interface was identified by high resolution electron microscopy. Regions of good matching alternate with regions which contain localized misfit dislocations. These observations will be discussed and compared with results published in the literature.
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