Electron Microscopy of Static and Dynamic Phenomena

Abstract

Due to the unique combination of real space and reciprocal space information, electron microscopy is an extremely powerful technique for revealing and analysing static or dynamic structural features. With modern electron microscopes structural details of the order of 0.2 nm can be directly observed so that structural defects can be studied down to an atomic scale. For a more general introduction on electron microscopy and the possibilities of the technique we refer e.g. to [1,2,3]. In this contribution we will treat four case studies taken from different types of materials; they are meant to illustrate the possibilities of electron microscopy combined with electron diffraction in the study of static and dynamic phenomena.