Abstract
It is becoming increasingly apparent that many fundamental properties of interfaces are affected by the presence of regular arrays of interfacial dislocations. The transmission electron microscope is the most suitable means for observing such dislocations. An outline of the various experimental methods available for characterizing interfacial dislocation structure will be presented, and a critical comparison made of their effectiveness. Various examples of interfacial dislocation analysis will be shown to emphasize the points made above.
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