Abstract
Abstract A lattice defect had been found by TEM in the superconducting compound V3Si (A15 structure). As a first approximation, it has been analysed as an a/2〈100〉 faulted dipole, by matching experimental micrographs with computer simulations. This faulted dipole accounts for the elastic deformation of the V3Si matrix caused by a needle-shaped precipitate. The purpose of this article is to assess the chemical and crystallographic natures of the precipitate. First, the structure factor contrast is studied in CTEM, together with high-magnification bright-field micrographs which enable us to observe the geometrical features of the cross-section of the precipitates. Then, the chemical nature of the precipitates is assessed by electron energy loss spectroscopy and its crystallographic nature is determined by convergent beam electron microdiffraction in a Philips EM 400 microscope equipped with a field-emission gun: the precipitates belong to the tetragonal V5Si3 phase. The orientation relationships between the...
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