Electron Microprobe Analyses and X-Ray Diffraction Study of SrSi2

Abstract

AbstractAlthough the phase SrSi2 has been previously recognized, it has been described only briefly in the literature.An alloy comprised of FeSi2, silicon, and the SrSi2 phase was examined on the electron microprobe. Optical and electron scanning images are correlated with X-ray scanning images for iron, silicon, calcium, and strontium. Quantitative microprobe analyses were made and corrected for absorption and the atomic number effect by several noncomputer methods. The corrections include as variables the X-ray intensities measured at several accelerating voltages. The effects of varying the electron beam size and accelerating potential are included. The results are compared to chemical analyses. The advantages of varying the accelerating voltage when correcting intensity data, increasing the beam size when surface preparation is a factor, and the importance of surface preparation at low accelerating voltages are discussed.An X-ray diffraction examination showed that the phase SrSi2 has a cubic unit cell with an a0 of 6.515 Å. There are four molecules per unit cell, and the most probable space group appears to be P213. The density was calculated as 3.45 (observed density >3.3).Metallographic observations with ordinary and polarized light and microhardness measurements are included.