Abstract
In an electron double-slit experiment, an optically zero propagation distance condition (infocus imaging condition), in which the double-slit position was imaged just on the detector plane (image plane), was realized in a 1.2 MV field-emission transmission electron microscope. Interference fringes composed of dot images were controlled by using two electron biprisms. Using a V-shaped double slit, we observed the interference features under the pre-interference condition, interference condition and post-interference condition of electron waves. We conclude that it is possible to observe the interference fringes only when the path information of the individual electrons is not available.
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