Electron impact scattering and calculated ionization cross sections for SFx (x = 1–5) radicals

Abstract

The spherical complex optical potential (SCOP) formalism is employed to solve the e−-SFx (x=1–5) scattering system. In this article, the total cross sections by electron impact from 50 to 5000eV are calculated. The complex scattering potential ionization contribution (CSP-ic) method is used to compute the electron-induced total ionization cross sections from the inelastic cross section in the energy range from ionization threshold to 5000eV. For most of the reported radicals, the magnitude and shape of cross section compares well with previous measurements and calculations, wherever available. However, for many targets results are predicted for the first time in this work. From the electron-impact scattering cross sections for the SFx (x=1–5) radicals, we also estimate the gas-kinetic radius and the van der Waals coefficient.