Abstract
The R-matrix method is used to calculate collision strengths for electron-impact excitation of Cu XX from its ground state. Configuration interaction wavefunctions are used to represent the lowest 15 LS coupled states which are retained in the R-matrix expansion. Effective collision strengths are calculated for transitions from the ground state to fine-structure levels of the excited states by employing a transformation of the LS coupled reactance matrices, and by assuming a Maxwellian distribution for the incident electron. This is the first detailed calculation on this ion in which the effects of exchange, channel couplings and short-range correlation effects are taken into account.
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