Abstract
At low temperatures T in the K-range, the mean free pathl * of carriers in very pure single crystals can attain several 100μm. The propagation of these so-called ballistic carriers is investigated using a small illuminated spot on a sample surface as a source of excited carriers, which is scanned over the sample surface. On the other side of the sample a point contact is fixed within a distance ofl * as a carrier detector. By measuring the voltage at the point contact with respect to a peripheral electrode as a function of the source position the anisotropic carrier propagation can be probed. Electron Focusing (EF), i.e. directions of enhanced or singular electron flux can be observed. The experimental focusing patterns for Bi, Ag, and W are presented, they turn out to be a characteristic fingerprint of the corresponding Fermi surface.
Published Version
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