Abstract
The effects of Ta content in CoCrTaPt thin films on the near-edge structure of Co and Cr L 2.3 absorption edges have been studied using parallel electron energy loss spectroscopy (PEELS). It was found that the addition of Ta decreased the 3d band occupancy in CoCrTaPt thin films. The addition of Ta was also observed to decrease the L 3/L 2 white line intensity ratio, which showed a qualitative correlation with Curie temperature measurements. This result indicates a decrease in the ferromagnetic exchange interaction between neighboring Co atoms which may account for the low noise of CoCrTaPt thin film media.
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