Abstract
The interaction of scanning transmission electron microscopy electrons with composite systems is investigated by following a mean-field theory of the effective response function. Expressions for the inverse longitudinal dielectric function of isolated spheres and cylinders are derived. Experimental valence loss spectra from SiO2 polymorphs are analyzed and the insensitivity of the plasmon peak to the density of the material is explained. @S0163-1829~97!02715-X#
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