Electron energy loss and secondary emission mechanisms in BaO

Abstract

Electron Loss Spectroscopy (ELS), X-ray Photoemission (XPS), Secondary Emission Energy Distribution, and Secondary Electron yield data have been obtained on both evaporated films and sprayed-on coatings of BaO. Using the ELS correlated with the XPS data, bulk and surface plasmon losses as well as excitonic and interband transition electron loss mechanisms have been identified. It was found that at low primary beam energies (<100 eV), structure in the secondary emission energy distribution could be correlated with a conduction band energy structure. This structure was consistent with the model used to explain the loss transitions. The structure in the energy distribution curves shows little, if any, correlation with plasmon decay mechanisms and other two-step electron emission processes. On the contrary, for the case of BaO (at least at low primary energies), the energy distribution data and structure in the secondary yield vs. primary beam energy data indicate that most secondaries are produced by direct excitation of secondaries by the primary electrons.