Abstract
By total photoelectron yield spectroscopy (TPYS), we have found a thermal instability of a negative electron affinity in hydrogen-terminated n-type diamond films, which has never been observed for intrinsic and p-type diamond films. Experimentally, we have succeeded in detecting surface defect states and surface valence band extended states on the same n-type sample after soft annealing from 100 to 300 °C, which allowed us to evaluate the surface Fermi level and surface band bending using phosphorus doping parameters. Our results show that “quasi-positive” electron affinity prevents electron emission from an n-type diamond film even though its surface has a negative electron affinity.
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