Abstract
A review is presented on recent investigations concerning the interaction of slow highly charged ions (HCI) with a clean metal surface. Detailed information on the generation and decay of transiently developing multiply excited “hollow atoms” can be gained from the measurements of total electron yields, electron energy distributions and, in particular, electron emission statistics. Complementary information on physical processes relevant for electron emission are provided by the projectile scattering characteristics and the emitted soft X-rays. A complete scenario of slow HCI-metal surface interaction, based on a recently developed classical over-the-barrier model, is discussed in the light of available experimental evidence.
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