Abstract
Electron diffusion lengths and escape probabilities from cesiated and hydrogenated polycrystalline diamond photocathodes were estimated by comparing the photoemission spectral response characteristics between the experimental and calculated data. As a result, the diffusion length for the polycrystalline diamond film used in this study was estimated to be as long as approximately 50 nm. Estimated escape probabilities of 0.8 and 0.2 were also obtained for cesiated and hydrogenated surfaces, respectively. The results suggest that the cesiated surface has a true negative electron affinity while the hydrogenated surface has an effective negative electron affinity.
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