Abstract
The epitaxy of evaporated Cu films on Cu single crystals has been investigated in situ under high-vacuum conditions with reflection HEED techniques. Spherically shaped Cu single crystals with high quality surfaces were used as substrates. The effects of condensation temperature and the annealing behavior were studied for the main low-index planes. A completely developed twin orientation of the film was found in all cases. For films deposited at room temperature the diffraction diagrams additionally contained a complete set of double diffraction spots.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
