Abstract
A quantitative method for the structural determination by electron diffraction of nanotubes of elliptical cross-section is developed as a general case while the cylindrical nanotubes are treated as a special class. We found that the chiral indices of a carbon nanotube can always be measured from the electron diffraction pattern regardless if the nanotube is circular or elliptical. An experimental electron diffraction pattern from a partly-deformed carbon nanotube is also analyzed. Assisted with numerical simulations, it is determined that the observed carbon nanotube has chiral indices (15,7) with 8° tilt relative to the horizontal plane and eccentricity of 0.553.
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