Abstract
Electron channeling patterns (ECPs) have been generated in the scanning electron microscope from hexagonal‐close‐packed ceramic (tungsten carbide and silicon carbide) single crystals extracted from commercially available powders. The crystals, commonly employed as reinforcing phases in ceramic composites, were typically platelet‐shaped with smooth surfaces. Their average diameter was 25 μm with a thickness ranging between 3 and 7 μm. After theoretical maps for the selected crystallographic poles were constructed with a procedure similar to that used for convergent beam electron diffraction, the experimental patterns were indexed and the crystallographic orientation of the crystals was determined. Specific applications for ceramic materials are discussed in comparison with previous work dealing with metals and, as an example of the application of the ECP method, the cleavage plane of fracture has been determined for the SiC platelet embedded in a Si3N4 matrix.
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