Abstract
SynopsisThe principles of an imaging technique for 2D materials are presented. It is based on the measurement of differential cross sections for electron capture induced by impact of keV-proton on such materials. We illustrate these principles for graphene target and demonstrate the selectivity of this technique upon materials, geometries and surface defects through the highly coherent phenomenon giving rise to the imaging pattern.
Highlights
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Synopsis The principles of an imaging technique for 2D materials are presented. It is based on the measurement of differential cross sections for electron capture induced by impact of keV-proton on such materials
Summary
HAL is a multi-disciplinary open access archive for the deposit and dissemination of scientific research documents, whether they are published or not. Home Search Collections Journals About Contact us My IOPscience This content has been downloaded from IOPscience. Ser. 635 032025 (http://iopscience.iop.org/1742-6596/635/3/032025) View the table of contents for this issue, or go to the journal homepage for more
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