Abstract
The technique of pick up and transfer of nanoscaled particles from the surface of a non-conductive substrate using a tungsten tip irradiated with focused electron beam is experimentally presented. The proposed technique of manipulation is implemented in a scanning electron microscope and allows to manipulate nanoparticles, with continuous visualization of the transfer process in real-time. The mechanism of the manipulation process is presented, which is based on the electrostatic interaction of charges produced by an electron beam in the tip, particle and substrate.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
