Abstract
The intensity and coherence of elastically and inelastically scattered electrons have been studied by the interference of electron-diffracted beams using a method of diffracted beam interferometry/holography (DBI/H). In the interferograms produced, fringes were found to exist from low to high scattering angles. The intensity and coherence of the fringes are useful for understanding the contrast mismatch between experimental and simulated images found in atomic resolution images of crystals produced by transmission electron microscopy (TEM) and annular dark-field (ADF) scanning transmission electron microscopy (STEM). The fringes disappear when the interfering beams are separated from an exact overlay position, which produces a measurement of the beam's lateral coherence and holds promise for measuring the coherence of the respective quasi-particles associated with the energy loss electrons.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
