Electron and hole transport in microcrystalline silicon solar cells studied by time-of-flight photocurrent spectroscopy

Abstract

A photocurrent time-of-flight study of carrier transport in microcrystalline silicon pin diodes prepared over a range of crystallinities is presented. Electron and hole drift mobilities at a crystalline volume fraction >0.35 are typically 3.8 and 1.3cm2/(Vs) respectively at 300K and a thickness to electric field ratio of 1.8×10−7cm2/V. A factor of five enhancement in hole mobility over amorphous silicon persists at a crystalline volume fraction as low as 0.1. Current decays are dispersive and mobilities are thermally activated, although detailed field-dependence is still under investigation. Evidence for a sharp fall in the density of states at 0.13eV above the valence band edge is presented. Similarities in behaviour with certain amorphous and polymorphous silicon samples are identified.