Abstract
Photoluminescence, capacitance-voltage and transmission electron microscopy studies have been carried out on structures containing a sheet of a self-assembled InAs quantum dots formed in GaAs matrices after the deposition of a 1.7 ML of InAs at 480°C. The use of n- and p-type GaAs matrices allows us to study separately electron and hole levels in the quantum dots by the capacitance-voltage technique. From analysis of photoluminescence and capacitance-voltage measurements it follows that the quantum dots have electron levels 80 meV below the bottom of the GaAs conduction band and two heavy-hole levels at 100 meV and 170 meV above the top of the GaAs valence band.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
