Abstract
The electron affinity ${}^{e}\phantom{\rule{-0.16em}{0ex}}A$(Se) of selenium is measured by photodetachment microscopy on a cesium-sputtering-produced Se${}^{\ensuremath{-}}$ ion beam using a single-mode CW dye laser. The measured value of the electron affinity is $16\phantom{\rule{0.16em}{0ex}}297.276(9)\phantom{\rule{0.28em}{0ex}}{\mathrm{cm}}^{\ensuremath{-}1}$, or 2.020 604 6(11) eV, which improves the accuracy of this atomic quantity by a factor of 60.
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