Abstract

The electric field induced “butterfly” curves and polarization loops, and the stress induced strain and polarization responses of [001], [011] and [111] oriented Pb(Mg1/3Nb2/3)O3-0.32PbTiO3 (PMN-0.32 PT) relaxor ferroelectric single crystals have been systematically investigated by experiment study. The focus is on the effect of constant compressive bias stress on the electromechanical coupling behavior along three crystallographic directions of PMN-0.32 PT single crystals. Dependence of the coercive field, remnant polarization, dielectric constant, and piezoelectric coefficient on the bias stress has been quantified for PMN-0.32 PT single crystals oriented in three different directions. Obtained results show that the large piezoelectric responses under zero compressive stress in [001] and [011] orientation are dominated by intrinsic crystal lattice while the engineered domain structure has a relatively minor effect. It is found that observed responses under stress cycle for [001] oriented crystals are due to polarization rotation and phase transformations. However, those for [011] and [111] oriented crystals are due to domain switching. The “butterfly” curves and polarization loops driven by electric field under different bias compression are described by two non-180° domain switching.

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