Abstract
This paper presents a theoretical examination of optically controlled electromagnetic wave-scattering characteristics of a rectangular cavity grating with a period that is much shorter than the wavelength of the incident electromagnetic wave using semiconductor plasma. The TM electromagnetic plane wave-scattering characteristics are analyzed theoretically using mode-matching technique. Furthermore, theoretical discussion is presented for TM electromagnetic plane wave scattering of the rectangular cavity grating from the viewpoint of its application to an optically controlled reflectarray antenna.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
