Abstract
A normalized two-dimensional band-limited Weierstrass fractal function is used for modeling the dielectric rough surface. An analytic solution of the scattered field is derived based on Kirchhoff approximation. The variance of scattering intensity is presented to study the fractal characteristics by theoretical analysis and numerical calculations. The important conclusion is obtained that the diffracted envelope slopes of scattering pattern can be approximated to a slope of linear equation. This conclusion will be applicable for solving the inverse problem of reconstructing rough surface and remote sensing.
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