Abstract
Electromagnetic emissions (EME) from Integrated Circuits (ICs) is increasing due to rapid increase in their operating frequencies and layout complexity. Near field analysis is one of the most common and effective method to measure EME. In this work, magnetic field and electric field of IC is analyzed at various distances from the surface of IC through simulation model. It is found that the magnetic field is major source of emission in vicinity of IC than electric field. It is also found that the location of maximum emission of magnetic field varies with the change in frequency as well. This work helps in determining the optimum distance between the adjacent devices to keep the EME in check.
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