Abstract
A theoretical and experimental study is made of the growth and decay constants of the brightness as functions of the rise time and amplitude of the pulse from electroluminescent structures based on manganese-doped zinc sulfide and deposited on smooth and rough substrates, and as functions of the rise time and amplitude of the ramped (linearly rising) exciting voltage. The curves obtained are used to determine a variety of parameters and characteristics of the electroluminescence process: the lifetime of the excited luminescence centers, the excitation and relaxation probabilities of luminescence centers per unit time, and the cross section of impact excitation of luminescence centers and their dependences on the rise time and amplitude of the linearly rising exciting voltage. Explanations are given for the fact that the indicated characteristics show different behavior for structures on smooth and rough substrates.
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