Abstract
The transmission/reflection spectra of bilayer structures consisting of thin amorphous and polycrystalline Pb(Zr0.52Ti0.48)O3 ferroelectric films deposited on dielectric substrates of magnesium oxide MgO and sapphire α-Al2O3 were measured in the frequency range of 5–4000 cm−1. Based on these spectra and using the dispersion analysis method, the spectra of complex dielectric permittivity ɛ*(ν) and dynamic conductivity σ′(ν) of the films were simulated, the electrodynamic parameters of the films were determined, and the dielectric dispersion responsible for the formation of static permittivity was found.
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