Abstract
The continuous passage of an electric current through pure sodium chloride bicrystals has been found to produce grain-boundary damage similar to that caused by electromigration in conducting thin films. The damage takes the form of an array of voids that seriously reduces the strength of the boundary. As in electromigration, the voids appear to be due to the condensation of vacancies following removal of ions by the current. However, the voids produced in tilt boundaries by current at 250‡ C have regularities of distribution and shape that suggest they are associated with separation of a second phase from segregated boundary impurity, the phase change disorder resulting from the precipitation reaction leading to rapid production of damage. The phase change process is discussed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.