Abstract
Cerium oxide films of preferred orientation are electrodeposited under anodic conditions. A complexing ligand, acetate, was used to stabilize the cerium (III) ion in solution for deposition of the thin films. Fourier transform infrared spectroscopy showed that the ligand and metal tended to bind as a weakly bidentate complex. The crystallite size of the films was in the nanometer range as shown by Raman spectroscopy and was calculated from X-ray diffraction data. Crystallite sizes from 6 to 20 nm were obtained under the anodic deposition conditions. Sintering of the (111) oriented films showed an increase in the (111) orientation with temperatures up to 900°C. Also, the crystallite size increased from 20 nm to 120 nm under sintering conditions. Addition of the deposited films to the substrate improved corrosion resistance for the substrate.
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