Abstract
Nanocrystalline Co45Ni10Fe24 films have been fabricated using cyclic voltammetry technique from the solutions containing sulfate, then characterized by scanning electron microscopy, X-ray diffraction and vibrating sample magnetometer. Meanwhile, Electrochemical Impedance Spectroscopy technique has been employed to probe into the nucleation/growth behavior of Co45Ni10Fe24 films. The results show that, the obtained Co45Ni10Fe24 film possesses low coercivity of 973.3A/m and high saturation magnetic flux density of 1.59×105A/m. Under the experimental conditions, the nucleation/growth process of Co45Ni10Fe24 films is mainly under activation control. With the increase of the applied cathodic potential bias, the charge transfer resistance for CoNiFe deposition decreases exponentially.
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