Abstract
Quantitative data on the in-plane anisotropy of charge transportin an aligned polyfluorene (PF) film can be obtained thanks to the technique described in this communication (see Figure for principle). Since the method revealed here does not require the deposition of electrode layers, it can be more readily applied to the characterization of a large number and variety of structured, thin-layer samples, free of the complications that often accompany DC measurements.
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