Abstract
As-deposited sol-gel derived amorphous tungsten oxide films transform into nanostructured films with an interconnected framework of grains and pores and a dominant triclinic crystalline phase upon annealing at . Transmission electron microscopy and scanning electron microscopy images clearly reveal the annealing-induced microstructural evolution for the film. Subsequent to lithium intercalation, the film annealed at shows quasi-reversible structural changes, as ascertained by X-ray diffraction and Fourier transform infrared spectral data. Dynamic transmission modulation for film revealed a high optical modulation of 72% and a coloration efficiency maximum of at under a lithium intercalation level of . X-ray photoelectron spectroscopy of the W 4f core levels demonstrated a progressive increase in the content at the expense of proportion as the insertion coefficient was raised from 0 to 0.25, with 0.20 as the threshold value above which the content exceeds the proportion. A new state also appears which acts to lower the coloration efficiency for . The presence of charged oxygen interstitials in the vicinity of electrochemically active tungsten sites is also responsible for the coloration efficiency decline at high ion insertion levels.
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