Electrochemical measurement of the diffusion coefficient of silver in thin films of V 2O 5P 2O 5 glass

Abstract

Thin film of V 2O 5P 2O 5 glass were made by vacuum evaporation. These layers have a molar composition 45V 2O 5− 55P 2O 5; their electronic conductivity at room temperature is about 10 −7 Ω −1 cm −1 ( E σ= 0.43 eV) . An electrochemical cell with glassy solid electrolyte, Ag/Ag + conductive glass/thin V 2O 5−P 2O 5 was used to measure the diffusion coefficient of silver, D Ag in these layers. Measurements at different temperatures lead to a value D Ag = D 0 exp. − E D RT where D 0 = 5.5 · 10 −1 cm 2/s, E D = 0.88 eV. At room temperature, D Ag is small and has an approximative value of 10 −15 cm 2 ·s −1.