Abstract
Study of electrochemical interfaces of non-metallic electrodes with synchrotron x-ray scattering technique is reported. Our recent in situ investigation of porous silicon during anodic dissolution and of ruthenium dioxide single crystals under reduction/oxidation electrochemical potential cycles are given as examples. In both cases, we show that the structural aspects uncovered by the synchrotron x-ray scattering techniques suggest direct relations to their non-structural properties of importance; for the porous silicon, the relation between the luminescence and pore structures, and for the ruthenium oxide, the relation between the modification of surface structure and the energy storage mechanism.
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