Abstract
This paper describes Ni electrodeposition as a method of producing metallic nanowires on a scanning probe tip. A polycarbonate porous membrane was used as a template for the growth of nanowires on a Si atomic force microscope (AFM) probe tip. A thin Pt cathode was deposited on the tip apex and onto the underlying porous membrane with the help of a focused ion beam. The number of nanowires deposited on the AFM probe tip was controlled by the cathode area and the duration of Ni deposition. Surface imaging was performed with the nanowire AFM probes. Elastic and inelastic deformations of the nanowires were observed, and the related beam mechanics were calculated.
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