Abstract
It is demonstrated that thin films of PLZT prepared by rf sputtering exhibit an electro-optic effect. The effects are measured using the reflection of the light polarized with the electric vector parallel to the incidence plane of the light. The reflected light intensity changes with the electric field and shows a decrease of about 33% at 12.5 kV/cm, when the light is incident at 70°. This technique turns out to be useful for the measurements of the electro-optic effects of thin films, and the results suggest the possibility of a reflection-type light modulator consisting of a thin film.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
