Abstract
Abstract Transport behavior of single layer graphene (SLG) grown by chemical vapor deposition technique on copper foil and transferred to SiO 2 /Si substrate has been studied by measuring the dc conductivity and Hall mobility in the temperature range 2–460 K. The samples of size 1 × 1 cm 2 have been found to be polycrystalline in nature. Raman spectrum has been studied at various locations of the sample and the formation of SLG has been confirmed. From dc conductivity and mobility measurements it has been concluded that the one dimensional grain boundary defects are mainly responsible for the deterioration of mobility and conductivity of charge carriers in the polycrystalline samples.
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