Abstract
The electrical transport and magnetoresistance properties of La0.6Pr0.1Sr0.3Mn1−xRuxO3(x=0.00,0.05and 0.15) were established. A careful study of the electrical transport properties has been carried out through the measurement of resistivity ρ (T). The dependence of electrical resistivity on temperature showed a metal-semi-conductor (m-SC) transition at TM-SC for all samples. When analyzing the data of electrical resistivity, it was concluded that the metallic (ferromagnetic) part of the resistivity (below TM-SC) can be explained by the following equation ρ(T)=ρ0+ρ2T2+ρ4.5T4.5, signifying the importance of the grain/domain boundary, electron–electron and magnon scattering processes. However, at a high temperature (T>TM-SC), the paramagnetic semiconducting regime, the adiabatic small polaron and Variable Range Hopping models were found to fit well. The electrical resistivity was fitted with the phenomenological percolation model. Hence, it was found that the estimated values of the resistivity were in good agreement with the experimental data. The values of magnetoresistance (CMR) were very high; about 53% even at 325K for x=0.15.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
