Abstract
GaAs nanowires were passivated by AlInP shells grown by the Au-assisted vapor-liquid-solid method in a gas source molecular beam epitaxy system. Transmission electron microscopy confirmed a core-shell GaAs-AlInP structure. Current-voltage measurements on ensemble nanowires indicated improved carrier transport properties in the passivated nanowires as compared to their unpassivated counterpart. Similarly, individual nanowires showed improved photoluminescence intensity upon passivation. A detailed model is presented to quantify the observed improvements in nanowire conduction and luminescence in terms of a reduction in surface charge trap density and surface recombination velocity upon passivation. The model includes the effects of high-level injection, bulk recombination, and surface recombination. The model can be used as a tool for assessing various passivation methods.
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