Electrical resistivity tomography of a gypsiferous subsurface soil: Geotechnical detection of a geoenvironmental phenomenon

Abstract

The near-surface soils are generally exposed to environmental changes and can be influenced by water, humidity, temperature, and other factors related to erosion or physical changes. It has been reported that serious distress occurred in the ground surface and below ground for many areas subjected to seasonal weather changes. The gypsum rich material is often linked to the cavity formation, uplift, and cracking of road surfaces due to the high solubility of gypsum in water and acidic media. Electrical resistivity techniques along with the advanced method of identifications (Scanning electron microscope; SEM and X-ray diffraction: XRD) were utilized to detect cavities and gypsum rich subsurface soils. A site where many cavities were formed as a result of dissolving gypsum and anhydrite was considered for this study. Syscal R1 electrical resistivity equipment (IRIS instrument) was used for several cross-sections established within the site. Several electrical resistivity tomography lines were constructed and studied. The SEM (scanning electron microscope) was used to examine and compare forms and fabrics of gypsum and minerals containing sulfates. The chemical analysis (EDAX) using an electron beam was conducted to establish elements present within tested samples. Quantitative chemical tests for some parameters including sulfate ions were carried out. A prediction model based on statistical correlations between sulfate ion content and the electrical resistivity is presented. Electrical resistivity is found to be inversely proportionalto the sulfate content for concentrations of 0 to 5%.