Abstract
We report growth of sheets (7–92 μm in thickness) composed of multiwalled carbon nanotubes (MCNs) and an experimental study of d.c. electrical resistance R( T) in the temperature range 7< T<300 K. The exp[( T 0/ T) −1/4] temperature dependence below ∼50 K, which is Mott's law of three-dimensional variable range hopping (3D VRH) conduction, is found. The result is supported by the estimated average hopping length, δ=0.16 μm, much smaller than our sample thickness. The temperature dependence of electrical resistance below 100 K normalized to their 100 K value, R( T)/ R(100 K), is in good agreement with that for an individual MCN. This agreement suggests that the transport mechanism for our sheets and for the individual MCN is the same.
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