Abstract

In this study, the electrical properties of Pt contacts on p-type GaN (p-GaN) activated in air were investigated. From the observed photoluminescence result, it is suggested that the hydrogenated Ga vacancies (i.e., VGaH2) were formed during the activation process. However, VGaH2 in p-GaN near the surface was transformed into VGa after Pt deposition, because Pt strongly absorbed hydrogen. A large number of VGa at the Pt/p-GaN interface would lead to the pinning of the Fermi level at 0.3 eV above the valence-band edge, as well as the formation of the low barrier at the interface, and the formation of the nonalloyed ohmic contacts due to the occurrence of the tunneling transmission for holes at the interface.

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