Abstract
The d.c. and a.c. behaviour of evaporated thin CeO2 films sandwiched between metal electrodes is explained by the presence of high resistance barriers at each electrode-CeO2 interface. In the case of Al electrodes the formation of an Al2O3 layer due to solid-state electrolysis accounts for electrical behaviour. For other metal electrodes Schottky-type depletion regions appear to govern electrical properties.
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